中国学者近期发表的论文
1.	A Layout-Based Rad-Hard DICE Flip-Flop Design Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, Vol., , DOI:10.1007/s10836-019-05773-4    DOI
2.	A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs Author: Yanyan Gao, Xi Li Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 685-695, DOI:10.1007/s10836-013-5406-8    DOI
3.	Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 849-859, DOI:10.1007/s10836-013-5415-7    DOI
4.	An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 555-565, DOI:10.1007/s10836-013-5382-z    DOI
5.	Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction Author: Lung-Jen Lee Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 625-634, DOI:10.1007/s10836-013-5404-x    DOI
6.	Prognostics of Analog Filters Based on Particle Filters Using Frequency Features Author: Min Li, Weiming Xian, Bing Long, Houjun Wang Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 567-584, DOI:10.1007/s10836-013-5383-y    DOI
7.	A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors Author: Bing Hou, Tong Liu, Jun Liu, Junli Chen, Faxin Yu, Wenbo Wang Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 649-652, DOI:10.1007/s10836-016-5613-1    DOI
8.	Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits Author: Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, Vol.32, 97-103, DOI:10.1007/s10836-015-5559-8    DOI
9.	A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in CMOS Technology Author: Dongdi Zhu, Jiongjiong Mo, Shiyi Xu, Yongheng Shang, Zhiyu Wang, Zhengliang Huang, Faxin Yu Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 393-397, DOI:10.1007/s10836-016-5584-2    DOI
10.	A Parallel Test Application Method towards Power Reduction Author: Ding Deng, Yang Guo, Zhentao Li Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, Vol.33, 157-169, DOI:10.1007/s10836-017-5656-y    DOI

同类著名期刊名称 h-index CiteScore IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE 326 19.67 IEEE Industrial Electronics Magazine 57 8.33 IEEE SIGNAL PROCESSING MAGAZINE 155 7.04 PROCEEDINGS OF THE IEEE 250 10.79 IEEE TRANSACTIONS ON FUZZY SYSTEMS 170 9.49 IEEE TRANSACTIONS ON IMAGE PROCESSING 242 9.63 IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS 236 9.65 PATTERN RECOGNITION 180 7.35 PROGRESS IN QUANTUM ELECTRONICS 58 7.94 IEEE TRANSACTIONS ON POWER ELECTRONICS 222 9.72

中科院JCR同大类学科的热搜期刊 浏览次数 ACS Applied Materials & Interfaces 1519958 CHEMICAL ENGINEERING JOURNAL 1207591 IEEE Access 1175874 APPLIED SURFACE SCIENCE 1168374 JOURNAL OF ALLOYS AND COMPOUNDS 1042079 JOURNAL OF MATERIALS SCIENCE 875026 MATERIALS LETTERS 798836 Nanoscale 707078 ADVANCED MATERIALS 672541 Journal of Materials Chemistry A 648829